Mostrar el registro sencillo del documento

dc.rights.licenseAtribución-NoComercial-SinDerivadas 4.0 Internacional
dc.contributor.advisorSandino del Busto, John William
dc.contributor.authorGómez Mateus, José Alfredo
dc.date.accessioned2024-05-24T20:58:20Z
dc.date.available2024-05-24T20:58:20Z
dc.date.issued2023
dc.identifier.urihttps://repositorio.unal.edu.co/handle/unal/86160
dc.descriptionilustraciones, diagramas
dc.description.abstractEsta investigación se enfoca en determinar la rugosidad superficial y su correlación con la dimensión fractal a partir de imágenes obtenidas mediante microscopía electrónica de barrido (SEM). Se empleó software libre para procesar imágenes y calcular parámetros de rugosidad y dimensión fractal en 3D. El estudio se centró en micrografías de una incisión en una lámina de aluminio, utilizando SIFT para detectar puntos característicos y el método de box counting para la dimensión fractal. Los resultados demostraron coherencia entre los perfiles de rugosidad medidos y los obtenidos mediante un perfilómetro, además de establecer correlaciones significativas entre la rugosidad promediada y la dimensión fractal. Este enfoque multidimensional proporciona una perspectiva más completa de la rugosidad, superando las limitaciones de las mediciones lineales y contribuyendo al entendimiento detallado de las superficies a nivel microscópico. (Texto tomado de la fuente).
dc.description.abstractThis research focuses on determining surface roughness and its correlation with the fractal dimension from images obtained through Scanning Electron Microscopy (SEM). Open-source software was used to process images and calculate roughness parameters and fractal dimension in 3D. The study centered on micrographs of an incision in an aluminum sheet, using SIFT to detect characteristic points and the box counting method for fractal dimension. The results demonstrated coherence between the measured roughness profiles and those obtained by a profilometer, in addition to establishing significant correlations between averaged roughness and fractal dimension. This multidimensional approach provides a more comprehensive perspective on roughness, overcoming the limitations of linear measurements and contributing to a detailed understanding of surfaces at the microscopic level.
dc.format.extentxv, 73 páginas
dc.format.mimetypeapplication/pdf
dc.language.isospa
dc.publisherUniversidad Nacional de Colombia
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/
dc.subject.ddc000 - Ciencias de la computación, información y obras generales::005 - Programación, programas, datos de computación
dc.subject.ddc620 - Ingeniería y operaciones afines::621 - Física aplicada
dc.titleObtención de la rugosidad a partir de imágenes obtenidas en un Microscopio Electrónico de Barrido
dc.typeTrabajo de grado - Maestría
dc.type.driverinfo:eu-repo/semantics/masterThesis
dc.type.versioninfo:eu-repo/semantics/acceptedVersion
dc.publisher.programBogotá - Ciencias - Maestría en Ciencias - Física
dc.contributor.researchgroupMicroscopía Electrónica
dc.description.degreelevelMaestría
dc.description.degreenameMagíster en Ciencias - Física
dc.description.researchareaMicroscopía electrónica
dc.identifier.instnameUniversidad Nacional de Colombia
dc.identifier.reponameRepositorio Institucional Universidad Nacional de Colombia
dc.identifier.repourlhttps://repositorio.unal.edu.co/
dc.publisher.facultyFacultad de Ciencias
dc.publisher.placeBogotá, Colombia
dc.publisher.branchUniversidad Nacional de Colombia - Sede Bogotá
dc.relation.referencesAkhtar, K., Khan, S. A., Khan, S. B. K., & Asiri, A. M. (2018). Scanning Electron Microscopy: Principle and Applications in Nanomaterials Characterization. Springer. https://doi.org/10.1007/978-3-319-92955-2 4
dc.relation.referencesAlcantarilla, P. F., Bartoli, A., & Davison, A. J. (2012). KAZE Features. Eur. Conf. on Computer Vision (ECCV)
dc.relation.referencesArasan, S., Akbulut, S., & Hasiloglu, A. S. (2011). The relationship between the fractal dimension and shape properties of particles. KSCE Journal of Civil Engineering, 15 (7), 1219-1225. https://doi.org/10.1007/s12205-011-1310-x
dc.relation.referencesBarash, D., Israeli, M., & Kimmel, R. (2001). An Accurate Operator Splitting Scheme for Nonlinear Diffusion Filtering. En M. Kerckhove (Ed.), Scale-Space and Morphology in Computer Vision (pp. 281-289, Vol. 2106). Springer. https://doi.org/10.1007/3- 540-47778-0 25
dc.relation.referencesBernardini, F., Mittleman, J., Rushmeier, H., Silva, C., & Taubin, G. (1999). The ballpivoting algorithm for surface reconstruction. IEEE Transactions on Visualization and Computer Graphics, 5 (4), 349-359
dc.relation.referencesBlachowski, A., & Ruebenbauer, K. (2009). Roughness method to estimate fractal dimension. Acta Physica Polonica A, 115 (3), 636-640
dc.relation.referencesBland, J. M., & Altman, D. G. (1986). Statistical methods for assessing agreement between two methods of clinical measurement. Lancet, 327 (8476), 307-310. https://doi.org/ 10.1016/S0140-6736(86)90837-8
dc.relation.referencesBonetto, R. D., Ladaga, J. L., & Ponz, E. (2006). Measuring Surface Topography by Scanning Electron Microscopy. II. Analysis of Three Estimators of Surface Roughness in Second Dimension and Third Dimension. Microscopy and Microanalysis, 12, 178-186
dc.relation.referencesBotsch, M., Kobbelt, L., Pauly, M., Alliez, P., & L´evy, B. (2010). Polygon Mesh Processing. A K Peters/CRC Press
dc.relation.referencesBradski, G., & Kaehler, A. (2008). Learning OpenCV: Computer vision with the OpenCV library. O’Reilly Media, Inc
dc.relation.referencesBrown, M., & Lowe, D. G. (2002). Invariant features from interest point groups. British Machine Vision Conference
dc.relation.referencesCalonder, M., Lepetit, V., Strecha, C., & Fua, P. (2010). BRIEF: Binary Robust Independent Elementary Features. European conference on computer vision, 778-792
dc.relation.referencesChongpu, Z., Hanaor, D., Proust, G., & Gan, Y. (2017). Stress-Dependent Electrical Contact Resistance at Fractal Rough Surfaces. Journal of Engineering Mechanics, 143 (3), B4015001. https://doi.org/10.1061/(ASCE)EM.1943-7889.0000967
dc.relation.referencesDatatab. (2021). Tutorial: Kendall’s Tau. Consultado el 8 de diciembre de 2023, desde https: //datatab.es/tutorial/kendalls-tau
dc.relation.referencesDektak 150 Profiler User’s Manual [Available from Veeco Instruments Inc., (www.veeco.com)]. (2007). Veeco Instruments Inc. Plainview, NY.
dc.relation.referencesEdelsbrunner, H., Kirkpatrick, D. G., & Seidel, R. (1983). On the shape of a set of points in the plane. IEEE Transactions on Information Theory, 29 (4), 551-559.
dc.relation.referencesElcometer. (2022). Rugosímetro MarSurf PS1 Elcometer 7061 [ Último acceso: 2023-04-04]. http ://www.elcometer .com/es/inspeccin - revestimientos/limpieza- de- superficie - perfil - de - la - superficie / rugosidad - de - la - superficie / rugosimetro - marsurf - ps1 - elcometer-7061.html
dc.relation.referencesEl-Gomati, M. M., Wells, T., Zha, X., Sykes, R., Russo, C. J., Henderson, R., & McMullan, G. (2021). 100 keV vacuum sealed field emission gun for high resolution electron microscopy. Journal of Vacuum Science & Technology B, 39 (6), 062804. https://doi. org/10.1116/6.0001275
dc.relation.referencesForum, O. Q. (2013, agosto). Is SURF algorithm used in OPENCV patented? https : / / answers.opencv.org/question/18259/is-surf-algorithm-used-in-opencv-patented/
dc.relation.referencesForum, O. Q. (2020, noviembre). Expired US patent on SIFT. https://answers.opencv.org/ question/238447/expired-us-patent-on-sift/
dc.relation.referencesGadelmawla, E., Koura, M., Maksoud, T., Elewa, I., & Soliman, H. (2002). Roughness parameters. Journal of Materials Processing Technology, 123 (1), 133-145. https://doi. org/https://doi.org/10.1016/S0924-0136(02)00060-2
dc.relation.referencesGoldstein, J. I., Newbury, D. E., Joy, D. C., Lyman, C. E., Echlin, P., Lifshin, E., Sawyer, L., & Michael, J. R. (2003). Scanning Electron Microscopy and X-Ray Microanalysis. Springer.
dc.relation.referencesGontard, L., L´opez-Castro, J., Gonz´alez-Rovira, L., V´azquez-Mart´ınez, J., Varela-Feria, F., Marcos, M., & Calvino, J. (2017). Assessment of engineered surfaces roughness by high-resolution 3D SEM photogrammetry. Ultramicroscopy, 177, 106-114. https:// doi.org/https://doi.org/10.1016/j.ultramic.2017.03.007
dc.relation.referencesHanaor, D., Gan, Y., & Einav, I. (2016). Static friction at fractal interfaces. Tribology International, 93, 229-238. https://doi.org/10.1016/j.triboint.2015.09.016
dc.relation.referencesHartley, R., & Zisserman, A. (2003). Multiple View Geometry in Computer Vision. Cambridge University Press
dc.relation.referencesHenao-Londoño, J. C., Riaño-Rojas, J. C., Gómez-Mendoza, J. B., & Restrepo-Parra, E. (2018). 3D Stereo Reconstruction of SEM Images. Modern Applied Science, 12 (12), 57. https://doi.org/10.5539/mas.v12n12p57
dc.relation.referencesKalvani, P. R., Jahangiri, A. R., Shapouri, S., Sari, A., & Jalili, Y. S. (2019). Multimode AFM analysis of aluminum-doped zinc oxide thin films sputtered under various substrate temperatures for optoelectronic applications. Superlattices and Microstructures, 132, 106173. https://doi.org/10.1016/j.spmi.2019.106173
dc.relation.referencesKayaalp, A., Rao, A. R., & Jain, R. (1990). Scanning Electron Microscope-Based Stereo Analysis. Machine Vision and Applications, 3, 231-246.
dc.relation.referencesKazhdan, M., Bolitho, M., & Hoppe, H. (2006). Poisson surface reconstruction. Proceedings of the fourth Eurographics symposium on Geometry processing, 7.
dc.relation.referencesKoga, D., Kusumi, S., Shibata, H., & Watanabe, M. (2021). Applications of Scanning Electron Microscopy Using Secondary and Backscattered Electron Signals in Neural Structure. Frontiers in Neuroanatomy, 15. https://doi.org/10.3389/fnana.2021.647428
dc.relation.referencesLi, Y., Shum, H.-Y., Tang, C.-K., & Szeliski, R. (2004). Stereo reconstruction from multiperspective panoramas. IEEE Transactions on Pattern Analysis and Machine Intelligence, 26 (1), 45-62. https://doi.org/10.1109/TPAMI.2004.1261078
dc.relation.referencesLin Chen, F. R., & Heipke, C. (2021). Feature detection and description for image matching: from hand-crafted design to deep learning. Geo-spatial Information Science, 24 (1), 58-74. https://doi.org/10.1080/10095020.2020.1843376
dc.relation.referencesLindeberg, T. (1998). Feature detection with automatic scale selection. International Journal of Computer Vision, 30 (2), 77-116
dc.relation.referencesLiu, Z., Wang, Y., Chen, J., Li, X., & Zhang, Z. (2019). Anisotropy of surface roughness of metals. Applied Surface Science, 479, 796-805. https://doi.org/10.1016/j.apsusc. 2019.02.163
dc.relation.referencesLowe, D. G. (1999). Object recognition from local scale-invariant features. Proceedings of the seventh IEEE international conference on computer vision, 2, 1150-1157.
dc.relation.referencesLowe, D. G. (2004). Distinctive image features from scale-invariant keypoints. International journal of computer vision, 60 (2), 91-110.
dc.relation.referencesLuo, W., Schwing, A. G., & Urtasun, R. (2016). Efficient Deep Learning for Stereo Matching. Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, 5695-5703.
dc.relation.referencesMa, Z., & Liu, S. (2018). A review of 3D reconstruction techniques in civil engineering and their applications. Advanced Engineering Informatics, 37, 163-174. https://doi.org/ https://doi.org/10.1016/j.aei.2018.05.005
dc.relation.referencesMajumdar, A., & Bhushan, B. (1990). Fractal Characterization and Simulation of Rough Surfaces. American Society of Mechanical Engineers
dc.relation.referencesMandelbrot, B. (1983). The Fractal Geometry of Nature. Henry Holt; Company. https:// books.google.com.co/books?id=0R2LkE3N7-oC
dc.relation.referencesMate, C. M. (2008). Tribology on the Small Scale: Mesoscopic Physics and Nanotechnology. Oxford University Press
dc.relation.referencesMilanese, E., Brink, T., Aghababaei, R., & Molinari, J.-F. (2019). Emergence of self-affine surfaces during adhesive wear. Nature Communications, 10 (1), 1116. https://doi. org/10.1038/s41467-019-09127-8
dc.relation.referencesMinitab. (2021). Estadísticos y gráficas para t de 1 muestra. Consultado el 8 de diciembre de 2023, desde https://support.minitab.com/es-mx/minitab/21/help-and-howto/ statistics/basic-statistics/how-to/1-sample-t/interpret-the-results/all-statisticsand- graphs/
dc.relation.referencesMoeslund, T. B. (2012). BLOB Analysis. En Introduction to Video and Image Processing: Building Real Systems and Applications (pp. 103-115). Springer London. https://doi. org/10.1007/978-1-4471-2503-7 7
dc.relation.referencesMontakhabi, F., Poursaeidi, E., Rahimi, J., & Sigaroodi, M. R. J. (2022). Investigation of the effect of BC layer surface roughness and TC layer porosity on stress values in plasma sprayed coatings based on SEM images. Materials Today Communications, 33, 104737. https://doi.org/https://doi.org/10.1016/j.mtcomm.2022.104737
dc.relation.referencesMoons, T., Van Gool, L., & Vergauwen, M. (2009). 3D Reconstruction from Multiple Images: Part 1 - Principles. Foundations and Trends in Computer Graphics and Vision, 4, 287-404
dc.relation.referencesNayak, S. R., Mishra, J., & Palai, G. (2019). Analysing roughness of surface through fractal dimension: A review. Image and Vision Computing, 89, 21-34. https://doi.org/https: //doi.org/10.1016/j.imavis.2019.06.015
dc.relation.referencesOdling, N. E. (1994). Natural fracture profiles, fractal dimension and joint roughness coefficients. Rock Mechanics and Rock Engineering, 27 (3), 135-153. https://doi.org/10. 1007/BF01020307
dc.relation.referencesOho, E. (2002). Digital image-processing technology useful for scanning electron microscopy and its practical applications. En P. W. Hawkes (Ed.), Electron Microscopy and Holography II (pp. 251-IV, Vol. 122). Elsevier. https://doi.org/https://doi.org/10. 1016/S1076-5670(02)80054-4
dc.relation.referencesOliveira, S. M. (2005). Analysis of Surface Roughness and Models of Mechanical Contacts [Tesis de grado]. Universita di Pisa
dc.relation.referencesOpen3D. (2023). Surface Reconstruction. http://www.open3d.org/docs/release/tutorial/ geometry/surface reconstruction.html
dc.relation.referencesOpenCV. (2021). Understanding Features [Consultado el 15 de Octubre de 2022]. https : //docs.opencv.org/3.4/df/d54/tutorial py features meaning.html
dc.relation.referencesParker, K. A., Ribet, S., Kimmel, B. R., dos Reis, R., Mrksich, M., & Dravid, V. P. (2022). Scanning Transmission Electron Microscopy in a Scanning Electron Microscope for the High-Throughput Imaging of Biological Assemblies. Biomacromolecules, 23 (8), 3235-3242. https://doi.org/https://doi.org/10.1021/acs.biomac.2c00323
dc.relation.referencesParsons, D. F., Walsh, R. B., & Craig, V. S. J. (2014). Surface forces: Surface roughness in theory and experiment. Journal of Chemical Physics, 140 (16), 164701. https://doi. org/10.1063/1.4871412
dc.relation.referencesPerona, P., & Malik, J. (1990). Scale-space and edge detection using anisotropic diffusion. IEEE Transactions on Pattern Analysis and Machine Intelligence, 12 (7), 629-639.
dc.relation.referencesPfeifer, P. (1988). Fractals in Surface Science: Scattering and Thermodynamics of Adsorbed Films. En R. Vanselow & R. Howe (Eds.), Chemistry and Physics of Solid Surfaces VII (pp. 283-305, Vol. 10). Springer Berlin Heidelberg. https://doi.org/10.1007/978- 3-642-73902-6 10
dc.relation.referencesQuan, L. (2010). Image-based modeling. Springer Science & Business Media.
dc.relation.referencesQuestionPro. (2020). Coeficiente de correlación de Spearman: ¿Qué es y cómo se calcula? Consultado el 8 de diciembre de 2023, desde https://www.questionpro.com/blog/es/ coeficiente-de-correlacion-de-spearman/
dc.relation.referencesReimer, L. (1998). Scanning Electron Microscopy: Physics of Image Formation and Microanalysis. Springer.
dc.relation.referencesRivera, M. H., & Melo, M. E. R. (2001). La rugosidad de las superficies: Topometría. Ingenierías, 4, 27-33.
dc.relation.referencesRosin, P. L. (1999). Measuring corner properties. Computer Vision and Image Understanding, 73 (2), 291-307.
dc.relation.referencesRosten, E., & Drummond, T. (2006). Machine learning for high-speed corner detection. European conference on computer vision, 430-443.
dc.relation.referencesRublee, E., Rabaud, V., Konolige, K., & Bradski, G. (2011). ORB: an efficient alternative to SIFT or SURF. in Proc. of the IEEE International Conf. on Computer Vision (ICCV).
dc.relation.referencesSarode, V. (2022). What Are Point Clouds? https://medium.com/analytics-vidhya/whatare- point-clouds-3655d565e142
dc.relation.referencesSato, H., O-Hori, M., & Nakayama, K. (1982). Surface Roughness Measurement by Scanning Electron Microscope. CIRP Annals, 31 (1), 457-462. https://doi.org/https://doi.org/ 10.1016/S0007-8506(07)63347-2
dc.relation.referencesShet, V., & Picard, R. W. (2005). Python for scientific computing. Computing in Science & Engineering, 7 (3), 10-20
dc.relation.referencesSun, T., Li, Y., Liu, Y., Deng, B., Liao, C., & Zhu, Y. (2023). Advanced scanning electron microscopy and microanalysis: Applications to nanomaterials. En Y. Yin, Y. Lu & Y. Xia (Eds.), Encyclopedia of Nanomaterials (First Edition) (First Edition, pp. 183-209). Elsevier. https://doi.org/https://doi.org/10.1016/B978-0-12-822425-0.00104-4
dc.relation.referencesTeam, O. (2023). Feature Detection and Description. https://docs.opencv.org/4.x/d5/d51/ group features2d main.html
dc.relation.referencesTESCAN a.s. (2014). Scanning Electron Microscope: Instructions for Use. TESCAN. https: //www.csuchico.edu/sem/ assets/documents/vega-manual-2014.pdf
dc.relation.referencesThäle, C., & Freiberg, U. (2008). A Markov Chain Algorithm for Determining Crossing Times Through Nested Graphs. Discrete Mathematics & Theoretical Computer Science.
dc.relation.referencesTöberg, S., & Reithmeier, E. (2020). Quantitative 3D Reconstruction from Scanning Electron Microscope Images Based on Affine Camera Models. Sensors, 20 (12), 3598. https: //doi.org/10.3390/s20123598
dc.relation.referencesVanderbilt University. (s.f.). The Hausdorff Dimension
dc.relation.referencesViper, Q. (2022). Making Fractal Shapes with Python
dc.relation.referencesWang, J., Wu, Y., Cao, Y., et al. (2020). Influence of surface roughness on contact angle hysteresis and spreading work. Colloid and Polymer Science, 298, 1107-1112. https: //doi.org/10.1007/s00396-020-04680-x
dc.relation.referencesWang, Y., Liu, R., Ji, H., Li, S., Yu, L., & Feng, X. (2022). Correlating mechanical properties to fractal dimensions of shales under uniaxial compression tests. Environmental Earth Sciences, 82 (1), 2. https://doi.org/10.1007/s12665-022-10642-z
dc.relation.referencesWeickert, J., Ishikawa, S., & Imiya, A. (1999). Linear scale-space has first been proposed in Japan. Journal of Mathematical Imaging and Vision, 10.
dc.relation.referencesWeisstein, E. W. (2023). Menger Sponge
dc.relation.referencesWhitehouse, D. J. (2010). Surfaces and their Measurement. Butterworth-Heinemann. https: //www.elsevier.com/books/surfaces-and- their-measurement/whitehouse/978- 1- 4377-3465-6
dc.relation.referencesZhai, C., Hanaor, D., & Gan, Y. (2017). Contact stiffness of multiscale surfaces by truncation analysis. International Journal of Mechanical Sciences, 131. https://doi.org/10.1016/ j.ijmecsci.2017.07.018
dc.relation.referencesZhou, Q.-Y., Park, J., & Koltun, V. (2018). Open3D: A Modern Library for 3D Data Processing. arXiv:1801.09847.
dc.rights.accessrightsinfo:eu-repo/semantics/openAccess
dc.subject.proposalRugosidad
dc.subject.proposalMicroscopio Electrónico de Barrido
dc.subject.proposalReconstrucción en 3D
dc.subject.proposalNubes de puntos
dc.subject.proposalRoughness
dc.subject.proposalScanning Electron Microscopy
dc.subject.proposal3D reconstruction
dc.subject.proposalPoint clouds
dc.subject.proposalFractal dimension
dc.subject.proposalAlgoritmos de detección de puntos característicos
dc.subject.proposalDimensión fractal
dc.subject.proposalCharacteristic point detection algorithms
dc.title.translatedDetermination of roughness from images obtained with a Scanning Electron Microscope
dc.type.coarhttp://purl.org/coar/resource_type/c_bdcc
dc.type.coarversionhttp://purl.org/coar/version/c_ab4af688f83e57aa
dc.type.contentText
dc.type.redcolhttp://purl.org/redcol/resource_type/TM
oaire.accessrightshttp://purl.org/coar/access_right/c_abf2
dcterms.audience.professionaldevelopmentEstudiantes
dcterms.audience.professionaldevelopmentInvestigadores
dc.subject.wikidataRugosidad (electrónica)
dc.subject.wikidatamicroscopio electrónico
dc.subject.wikidataelectron microscope
dc.subject.wikidatadimensión fractal
dc.subject.wikidatafractal dimension
dc.subject.wikidataalgoritmo
dc.subject.wikidataalgorithm


Archivos en el documento

Thumbnail

Este documento aparece en la(s) siguiente(s) colección(ones)

Mostrar el registro sencillo del documento

Atribución-NoComercial-SinDerivadas 4.0 InternacionalEsta obra está bajo licencia internacional Creative Commons Reconocimiento-NoComercial 4.0.Este documento ha sido depositado por parte de el(los) autor(es) bajo la siguiente constancia de depósito