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Obtención de la rugosidad a partir de imágenes obtenidas en un Microscopio Electrónico de Barrido
dc.rights.license | Atribución-NoComercial-SinDerivadas 4.0 Internacional |
dc.contributor.advisor | Sandino del Busto, John William |
dc.contributor.author | Gómez Mateus, José Alfredo |
dc.date.accessioned | 2024-05-24T20:58:20Z |
dc.date.available | 2024-05-24T20:58:20Z |
dc.date.issued | 2023 |
dc.identifier.uri | https://repositorio.unal.edu.co/handle/unal/86160 |
dc.description | ilustraciones, diagramas |
dc.description.abstract | Esta investigación se enfoca en determinar la rugosidad superficial y su correlación con la dimensión fractal a partir de imágenes obtenidas mediante microscopía electrónica de barrido (SEM). Se empleó software libre para procesar imágenes y calcular parámetros de rugosidad y dimensión fractal en 3D. El estudio se centró en micrografías de una incisión en una lámina de aluminio, utilizando SIFT para detectar puntos característicos y el método de box counting para la dimensión fractal. Los resultados demostraron coherencia entre los perfiles de rugosidad medidos y los obtenidos mediante un perfilómetro, además de establecer correlaciones significativas entre la rugosidad promediada y la dimensión fractal. Este enfoque multidimensional proporciona una perspectiva más completa de la rugosidad, superando las limitaciones de las mediciones lineales y contribuyendo al entendimiento detallado de las superficies a nivel microscópico. (Texto tomado de la fuente). |
dc.description.abstract | This research focuses on determining surface roughness and its correlation with the fractal dimension from images obtained through Scanning Electron Microscopy (SEM). Open-source software was used to process images and calculate roughness parameters and fractal dimension in 3D. The study centered on micrographs of an incision in an aluminum sheet, using SIFT to detect characteristic points and the box counting method for fractal dimension. The results demonstrated coherence between the measured roughness profiles and those obtained by a profilometer, in addition to establishing significant correlations between averaged roughness and fractal dimension. This multidimensional approach provides a more comprehensive perspective on roughness, overcoming the limitations of linear measurements and contributing to a detailed understanding of surfaces at the microscopic level. |
dc.format.extent | xv, 73 páginas |
dc.format.mimetype | application/pdf |
dc.language.iso | spa |
dc.publisher | Universidad Nacional de Colombia |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ |
dc.subject.ddc | 000 - Ciencias de la computación, información y obras generales::005 - Programación, programas, datos de computación |
dc.subject.ddc | 620 - Ingeniería y operaciones afines::621 - Física aplicada |
dc.title | Obtención de la rugosidad a partir de imágenes obtenidas en un Microscopio Electrónico de Barrido |
dc.type | Trabajo de grado - Maestría |
dc.type.driver | info:eu-repo/semantics/masterThesis |
dc.type.version | info:eu-repo/semantics/acceptedVersion |
dc.publisher.program | Bogotá - Ciencias - Maestría en Ciencias - Física |
dc.contributor.researchgroup | Microscopía Electrónica |
dc.description.degreelevel | Maestría |
dc.description.degreename | Magíster en Ciencias - Física |
dc.description.researcharea | Microscopía electrónica |
dc.identifier.instname | Universidad Nacional de Colombia |
dc.identifier.reponame | Repositorio Institucional Universidad Nacional de Colombia |
dc.identifier.repourl | https://repositorio.unal.edu.co/ |
dc.publisher.faculty | Facultad de Ciencias |
dc.publisher.place | Bogotá, Colombia |
dc.publisher.branch | Universidad Nacional de Colombia - Sede Bogotá |
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dc.rights.accessrights | info:eu-repo/semantics/openAccess |
dc.subject.proposal | Rugosidad |
dc.subject.proposal | Microscopio Electrónico de Barrido |
dc.subject.proposal | Reconstrucción en 3D |
dc.subject.proposal | Nubes de puntos |
dc.subject.proposal | Roughness |
dc.subject.proposal | Scanning Electron Microscopy |
dc.subject.proposal | 3D reconstruction |
dc.subject.proposal | Point clouds |
dc.subject.proposal | Fractal dimension |
dc.subject.proposal | Algoritmos de detección de puntos característicos |
dc.subject.proposal | Dimensión fractal |
dc.subject.proposal | Characteristic point detection algorithms |
dc.title.translated | Determination of roughness from images obtained with a Scanning Electron Microscope |
dc.type.coar | http://purl.org/coar/resource_type/c_bdcc |
dc.type.coarversion | http://purl.org/coar/version/c_ab4af688f83e57aa |
dc.type.content | Text |
dc.type.redcol | http://purl.org/redcol/resource_type/TM |
oaire.accessrights | http://purl.org/coar/access_right/c_abf2 |
dcterms.audience.professionaldevelopment | Estudiantes |
dcterms.audience.professionaldevelopment | Investigadores |
dc.subject.wikidata | Rugosidad (electrónica) |
dc.subject.wikidata | microscopio electrónico |
dc.subject.wikidata | electron microscope |
dc.subject.wikidata | dimensión fractal |
dc.subject.wikidata | fractal dimension |
dc.subject.wikidata | algoritmo |
dc.subject.wikidata | algorithm |
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