Teoría básica de microscopía electrónica de transmisión

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dc.contributor.authorAlfonso Orjuela, José Edgar
dc.contributor.authorCorredor P., Dery Esmeralda
dc.date.accessioned2021-08-13T20:41:13Z
dc.date.available2021-08-13T20:41:13Z
dc.date.issued2009
dc.descriptionIlustraciones y fotografíasspa
dc.description.abstractEn este documento se presentan los conceptos físicos básicos que acercarán a los estudiantes de las carreras de Ciencias e Ingeniería a los conocimientos físicos involucrados, tanto en los procesos que ocurren en la generación de un patrón de difracción de electrones, como en la manera de interpretarlos y utilizarlos en la determinación de la estructura y grado de cristalinidad de materiales de interés científico y con aplicación tecnológica. (Texto tomado de la fuente).spa
dc.description.editionPrimera ediciónspa
dc.description.notesIncluye índice analíticospa
dc.description.notesPrimera reimpresión 2009spa
dc.format.extent98 páginasspa
dc.format.mimetypeapplication/pdfspa
dc.identifier.instnameUniversidad Nacional de Colombiaspa
dc.identifier.reponameRepositorio Institucional Universidad Nacional de Colombiaspa
dc.identifier.repourlhttps://repositorio.unal.edu.co/spa
dc.identifier.urihttps://repositorio.unal.edu.co/handle/unal/79952
dc.language.isospaspa
dc.publisherUniversidad Nacional de Colombiaspa
dc.publisher.departmentSede Bogotáspa
dc.publisher.placeBogotá, Colombiaspa
dc.relation.citationeditionPrimera ediciónspa
dc.relation.ispartofseriesColección textos;
dc.relation.referencesBarrera H. y Cárdenas R., El microscopio óptico, Editorial Plaza y Valdés, México, 29-30, 34-36, 1997.spa
dc.relation.referencesMichael J. E., Stereomicroscopes by the British Micromount Society BMS Occasional Paper, No. 6, 12-14, 1995.spa
dc.relation.referencesGlasgow H., First in Field by 200 Years, 35, 1981.spa
dc.relation.referencesGabor D., A new microscopic principle, Nature, 161, 777-778, 1948.spa
dc.relation.referencesGovi G., Il microscopio composto inventato da Galileo, Italian Physical Society, 25(1), 162-164, 1889.spa
dc.relation.referencesFord B. J., The Discovery of Giardia, Microscope, 53, 147-153, 2005.spa
dc.relation.referencesHull D. F. R. S. Eng F. Robert Hooke, A Fractographic Study of Kettering-Stone, Notes Rec. R. Soc., 51(1), 45-55, 1997.spa
dc.relation.referencesLister J. J., Some Observations on the Structure and Functions of Tubular and Cellular Polypi, and of Ascidiae, Philosophical Transactions of the Royal Society, 124, 365-388, 1834.spa
dc.relation.referencesRuska E., The Development of the Electron Microscope and of Electron Microscopy, Rev. Mod. Phys., 59, 627-638, 1987.spa
dc.relation.referencesEvenett P., Köhler Illumination Centenary, Royal Microscopical Society, Oxford, United Kingdom, 32, 1994.spa
dc.relation.referencesHartley, W.G., The Light Microscope: Its Use and Development, Senecio Publishing Co, 1993.spa
dc.relation.referencesGregory, Don A., Rayleigh Criteria Separation of Optical correlation signals, Applied Optics, 26, 3170-3171, 1987.spa
dc.relation.referencesWighting M. J., ERIC Journal, 27, 58-61, 2004.spa
dc.relation.referencesAsimov I., Biographical Encyclopedia of Science and Technology, Doubleday, 1982.spa
dc.relation.referencesLozano, V. y Morales, A., Introducción a la microscopía electrónica, 1996.spa
dc.relation.referencesEdington J. W., Practical Electron Microscopy in Materials Science, Philips Electron Optics, Egerton RF, 1996.spa
dc.relation.referencesWilliams D. B. and Carter C. B., Transmission Electron Microscopy: A Textbook for Materials Science, Cambridge University Press, 1999.spa
dc.relation.referencesThe microscope. http://em-outreach.ucsd.edu/web-course/SecI.A/Sec-I.A.html. Origin (07/07).spa
dc.relation.referencesMüller E. W., The Field Ion Microscope. Z. Phys, 131, 136-142, 1951.spa
dc.relation.referencesTecnai Basic Manual, FEI Electron Optics, B. V. Eindhoven, The Netherlands, 2002.spa
dc.relation.referencesWilliams D.B. and Carter C. B., Transmission Electron Microscopy, Basics Kluwer Academic Pub., 1996.spa
dc.relation.referencesIpohorski M., Microscopía electrónica de láminas delgadas, Instituto de Tecnología Profesor Jorge A. Savato, Buenos Aires, 1996.spa
dc.relation.referencesKarlík M., Introduction to High-Resolution Transmission Electron Microscopy, ÈVUT: Faculty of Nuclear Sciences and Physical Engineering, Department of Materials (in Czech), 1993.spa
dc.relation.referencesMiroslav Karlik, Lattice Imaging in Transmission electron Microscopy, Materials Structure, 8(1), 2001.spa
dc.relation.referencesOtten M. T., Alignement of the Transmission Electron Microscope, Philips Electron Optics, 1993.spa
dc.relation.referencesReimer L., Transmission Electron Microscopy, Springer-Verlag, 1989.spa
dc.relation.referencesScherzer O., The Theoretical Resolution Limit of the Electron Microscope, J. Appl. Physics, 20, 20-29, 1949.spa
dc.relation.referencesSpence J. C. H., Experimental High-Resolution Electron Microscopy, Oxford University Press, 1988.spa
dc.relation.referencesMetherell A. J. F., Diffraction of Electrons by Perfect Crystals, In: ‘Electron Microscopy in Materials Science’, 3rd Course of Int. School of Electron Microscopy, Ettore Majorana, eds U. Valdrè, E. Ruedl, EEC, 2, 397-552, 1973.spa
dc.relation.referencesEdington J. W., Practical Electron Microscopy in Materials Science, N. V. Philips Gloeilampenfabrieken, Eindhoven, 1976.spa
dc.relation.referencesGoodhew P. J., Humphreys J. and Beanland R., Electron Microscopy and Analysis, Third edition, Taylor y Francis e-Library, 2001.spa
dc.relation.referencesYao N. and Wang Z. L., Handbook of Microscopy for Nanotechnology, Academic Publishers, United States of America, 2005.spa
dc.relation.referencesLeica Microsystems Inc., La teoría del microscopio, Educational and Analytical Division, Buffalo, New York, 2000.spa
dc.relation.referencesFischione P. E., Materials Specimen Preparation for Transmission Electron Microscopy, E. A. Fischione Instruments, 1-10, 1990.spa
dc.relation.referencesGatan Inc./OGI, Joint Workshop on TEM Specimen Preparation, 3-18, 2002.spa
dc.relation.referencesSolórzano G., Apuntes de clase, 21-33, 2001.spa
dc.relation.referencesRomero de Pérez G., Apuntes de clase, 101-150, 2005.spa
dc.relation.referencesTipler, P. A. and Llewellyn R. A, Modern Physics, 4 ed. W. H. Freeman and Company, 203-4, 222-3, 236, 2003.spa
dc.relation.referencesEdington J. W. Practical Electron Microscopy in Materials Science, Philips Electron Optics, Egerton RF, 1996.spa
dc.relation.referencesBall, C. J., An Introduction to the Theory of Diffraction, Pergamon. NY, 1971.spa
dc.relation.referencesHirsch P., Electron Microscopy of Thin Crystals, 2 ed. Krieger, Melbourne. FL, 1977.spa
dc.relation.referencesWilman H., The Interpretation and Application of ElectronDiffraction Kikuchi-Line Patterns- Part 11. The Methods of Indexing the Patterns, Applied Physical Chemistry Laboratories, Imperial College, London MS, 1947.spa
dc.relation.referencesEdington J. W., Practical Electron Microscopy in Materials Science, Philips Electron Optics, Egerton RF, 1996.spa
dc.relation.referencesLoretto, M. H. and Smallman R. E., Defect Analysis in electron Microscopy, John Wiley & Sons, New York, 1975.spa
dc.relation.referencesBuitrago J., Crecimiento de películas delgadas de NbN por la técnica de pulverización catódica y caracterización estructural y eléctrica, Tesis de Maestría, Bogotá, Universidad Nacional de Colombia, 2008.spa
dc.relation.referencesKittel C., Introduction to Solid State Physics, John Wiley & Sons. Inc., New York, 1968.spa
dc.relation.referencesWilliams D. B. and Carter C. B., Transmission Electron Microscopy, Basics Kluwer Academic Pub, 1996.spa
dc.relation.referencesDel Río D., Oxidación parcial de metano sobre catalizadores de MoO3 soportado sobre SiO2, Tesis de Maestría, Bogotá, Universidad Nacional de Colombia, 2008.spa
dc.relation.referencesLoreto M. H. and Smallman R. E., Defect analysis in electron microscopy, 29, 1975.spa
dc.relation.referencesSeifriz, W., Protoplasm, McGraw-Hill, New York, 99-100, 1936.spa
dc.relation.referencesFEI Company, FEI Electron Optics Company, B. V. Eindhoven, the Netherlands, 1-3, 2002.spa
dc.relation.referencesLoreto M. H. and Samllman R. R., Defect Analysis in Electron Microscopy, 29, 1975.spa
dc.relation.referencesJohn Mayall, Jr., Lectures on the History of the Microscope by British Collector, Journal of the Society of the Arts, 1885-1888.spa
dc.rightsDerechos Reservados al Autor, 2009spa
dc.rights.accessrightsinfo:eu-repo/semantics/openAccessspa
dc.rights.licenseAtribución-NoComercial-SinDerivadas 4.0 Internacionalspa
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/spa
dc.subject.ddc500 - Ciencias naturales y matemáticasspa
dc.subject.lembMicroscopía electrónicaspa
dc.subject.lembInstrumentos ópticosspa
dc.subject.lembDifracciónspa
dc.subject.proposalMicroscopiosspa
dc.subject.proposalMicrografíaspa
dc.subject.proposalLentesspa
dc.titleTeoría básica de microscopía electrónica de transmisiónspa
dc.typeLibrospa
dc.type.coarhttp://purl.org/coar/resource_type/c_2f33spa
dc.type.coarversionhttp://purl.org/coar/version/c_ab4af688f83e57aaspa
dc.type.contentTextspa
dc.type.driverinfo:eu-repo/semantics/bookspa
dc.type.redcolhttp://purl.org/redcol/resource_type/LIBspa
dc.type.versioninfo:eu-repo/semantics/acceptedVersionspa
dcterms.audienceGeneral
oaire.accessrightshttp://purl.org/coar/access_right/c_abf2spa

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